TI Debuts 3 GSPS ADC and 800V Controller for AI Data Centers
San Jose – October 12, 2026 -- Texas Instruments (Nasdaq: TXN) unveiled the ADC34DSO75, a 3 gigasamples-per-second analog-to-digital converter that it says enables 24/7, low-power, event-based remote monitoring at nanosecond resolution, thousands of times faster than current solutions.
The company debuted the device at the Open Compute Project (OCP) Global Summit alongside two other analog products aimed at AI data center power instability, inadequate real-time monitoring and signal degradation. TI says these problems can lead to costly downtime.
ADC34DSO75 targets nanosecond power-rail glitches that cause downtime
TI says existing monitoring tools often miss nanosecond-level power-rail glitches behind unplanned outages. The ADC34DSO75 combines ultra-high-speed sampling with on-chip digital signal processing in a small form factor to detect and capture transient fault events in real time.